Neocera Magma brings to the semiconductor failure analysis community its Magma magnetic field imaging microscopes, which can localize all static defects – shorts, leakages and opens – in microelectronic systems. Neocera’s Magma systems can accommodate 300 mm wafers for die-level interconnects, PC boards for final packaging, and all types of device packages including multi-chip modules featuring heterogeneous integration of disparate devices, stacked devices, 3DICs and SiP. The new platform has been designed using end user’s inputs to provide user-friendly setup and operation, as well as higher throughput and lower operating costs. Following are a sampling of the features that are standard with new Magma microscopes:
- High visibility provided by LEDs and web cam
- Single frame occupies less lab space and shortens electrical connections
- Added space for easy backside probing
- User-friendly software interface simplifies setup and analysis
- New cryogenics simplifies cooling and reduce operating costs
- Large samples can be handled with expanded operating space
- Precise high-resolution scanning is enabled with XYZ/tilt stages
- Vibration isolation improvements provide stable scanning environment
- Workspace is designed ergonomically
- Component layout is designed for superior serviceability
Conferences
- International Symposium on the Physical and Failure Analysis of Integrated Circuits
- European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
- International Symposium for Testing and Failure Analysis
- NANO Testing Symposium
- IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits
- Center for Advanced Life Cycle Engineering
- European Conference on Applied Superconductivity
- IEEE International Reliability Physics Symposium
Partners
